Each of the three cleanrooms is equipped with an optical microscope for process assessment. In addition process control, assessment, metrology and reporting tools include a field-emission scanning electron microscope (SEM) , a stylus profilometer, an optical profilometer, a contac angle masurement setup, analytical scales. A second, EDX-equipped, SEM is available outside the facility and its use canbe discussed if necessary. In addition, IOM-CNR institute hosts a plethora of characterization techniques, from TEM to STM, AFM, XPS, XRD, and the synchrotron beamlines. Plus al the synthesys setups (MBEs, CVDs, furnaces, etc). Although the other IOM laboratories are not within the FNF facility and its fee scheme, you can discuss with the respective labs responsibles other forms of collaboration or service agreements.
Electron Microscopy
- Zeiss Leo 1540XB
- EDS
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Cryo preparation system for scanning electron microscopy PP3010 from Quorum Technology
Optical Microscopes
Profilometers
Contact Angle